The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Sep. 24, 2008
Applicants:

LI Hong, San Diego, CA (US);

Mark Takita, Palo Alto, CA (US);

W. Thomas Novak, Hillsborough, CA (US);

Inventors:

Li Hong, San Diego, CA (US);

Mark Takita, Palo Alto, CA (US);

W. Thomas Novak, Hillsborough, CA (US);

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); H04N 5/262 (2006.01); G06K 9/34 (2006.01); G03B 13/18 (2006.01);
U.S. Cl.
CPC ...
G03B 13/18 (2013.01);
Abstract

A system for providing an adjusted image of a scene includes an optical assembly, a capturing system coupled to the optical assembly, and a control system. The optical assembly is adjustable to alternatively be focused on a first focal area and a second focal area that is different than the first focal area. The capturing system captures a first frame of the scene when the optical assembly is focused at the first focal area, and a second frame of the scene when the optical assembly is focused at the second focal area. The first frame includes a plurality of first pixels and the second frame includes a plurality of second pixels. The control system analyzes the first frame and the second frame and utilizes graph cuts techniques to assign a depth label to at least a portion of the first frame.


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