The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Oct. 17, 2013
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Tadashi Hayashi, Chino, JP;

Shigeki Kanazawa, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/038 (2013.01); G09G 5/00 (2006.01); G09G 3/20 (2006.01);
U.S. Cl.
CPC ...
G09G 3/20 (2013.01);
Abstract

A method for calibrating an image processing device performs first processing to first image data, using a three-dimensional lookup table, and performing second processing to image data that has been processed by the first processing, using a one-dimensional lookup table on the output side of the three-dimensional lookup table. The method includes first setting step for setting first calibration information for each color component to have a target color temperature at the one-dimensional lookup table, second setting step for setting second calibration information for mapping the first image data to a target color space at the three-dimensional lookup table, and correction step for correcting the first calibration information based on an error from a target characteristic using image data that has been processed by the second processing.


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Hayashi, Tadashi. (2015). Calibration method for image processing device, calibration device, image processing device, and display module (U.S. Patent No. 9024937). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9024937

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