The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Oct. 06, 2009
Applicants:

Toon Hendrik Evers, Eindhoven, NL;

Wendy Uyen Dittmer, Eindhoven, NL;

Inventors:

Toon Hendrik Evers, Eindhoven, NL;

Wendy Uyen Dittmer, Eindhoven, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/553 (2006.01); G01N 33/543 (2006.01); B82Y 25/00 (2011.01); G01N 27/74 (2006.01); G01R 33/09 (2006.01); G01R 33/12 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54326 (2013.01); B82Y 25/00 (2013.01); G01N 27/745 (2013.01); G01R 33/093 (2013.01); G01R 33/1269 (2013.01); G01N 35/0098 (2013.01);
Abstract

The invention relates to a method and a device () for determining the amount of a target component () in a sample, wherein magnetic particles () can bind to a contact surface () with kinetics that depend on the sample-amount of the target component. The method comprises at least two washing steps during which magnetic particles () are magnetically moved away from the contact surface () and corresponding measurements of the remaining amount of magnetic particles () at the contact surface (). The amount of target component in the sample is estimated from at least one of such measurement results. The measurement allows to determine also high concentrations of target component for which the sensor surface () is saturated in a steady-state.


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