The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Mar. 15, 2013
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Yumi Fukuda, Tokyo, JP;

Masahiro Kato, Naka-gun, JP;

Naotoshi Matsuda, Chigasaki, JP;

Keiko Albessard, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09K 11/77 (2006.01); C09K 11/08 (2006.01); F21K 99/00 (2010.01); H01L 33/50 (2010.01); H01L 33/64 (2010.01);
U.S. Cl.
CPC ...
C09K 11/7728 (2013.01); C09K 11/0883 (2013.01); C09K 11/7734 (2013.01); F21K 9/56 (2013.01); H01L 33/502 (2013.01); H01L 33/504 (2013.01); H01L 33/507 (2013.01); H01L 33/641 (2013.01);
Abstract

According to one embodiment, the luminescent material exhibits a luminescence peak in a wavelength ranging from 490 to 580 nm when excited with light having an emission peak in a wavelength ranging from 250 to 500 nm. The luminescent material has a diffraction peak intensity of the largest peak detected at 2θ=30.1-31.1° that is higher than the diffraction peak intensity of the peak detected at 2θ=25.0-26.0° in X-ray diffraction by the Bragg-Brendano method using Cu-Kα line and its composition is represented by (SrEu)AlSiON(a part of the Sr may be substituted by at least one selected from Ba, Ca, Mg and Na, 0<x≦1, −0.1≦y≦0.3, −3≦z≦−0.52, and −1.5≦u≦−0.3, −3<u−w≦1).


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