The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Feb. 28, 2013
Ca, Inc., Islandia, NY (US);
Marco Gagliardi, Brisbane, CA (US);
Andreas Reiss, Frankfurt, DE;
CA, Inc., New York, NY (US);
Abstract
A technique for detecting patterns in the execution of an application. The technique identifies a sequence of methods which are invoked and obtains information regarding attributes of the methods. For example, attribute information such as a class hierarchy can be obtained from an instrumentation API. A data structure representing a hierarchy of the attributes can be created and compared to one or more reference data structures which describe patterns of interest. A decision can be made to provide instrumentation for the methods having the matching attributes. The decision can consider how frequently the pattern is detected and overhead costs of the instrumentation.