The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Apr. 12, 2013
Applicant:

Google Inc., Mountain View, CA (US);

Inventors:

Manish Lachwani, Sunnyvale, CA (US);

Jay Srinivasan, San Francisco, CA (US);

Pratyus Patnaik, San Francisco, CA (US);

Timothy D. Wang, Oakland, CA (US);

Assignee:

Google Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01); G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3672 (2013.01);
Abstract

A system is described for testing an application on one or more host devices in a host device farm using an application programming interface ('API') to send a test package containing an application to a test server. The sending may be initiated by a single action such as a click on a control in a user interface, or may be automatic such as on completion of a build. The test server may then execute and test the application across one or more host devices using one or more testing frameworks. Test results based at least in part on the type of testing framework used in the application may then be provided to a client device.


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