The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9021308 B1

Expired

Date of Patent:

Apr. 28, 2015

Filed:

Aug. 09, 2011

Analyzing a process of software defects handling using percentile-based metrics

Applicants:

Murray Cantor, Westwood, MA (US);

Amit Fisher, Nofit, IL;

Sateesh S Kannegala, Bangalore, IN;

Segev Wasserkrug, Haifa, IL;

Sergey N Zeltyn, Haifa, IL;

Inventors:

Murray Cantor, Westwood, MA (US);

Amit Fisher, Nofit, IL;

Sateesh S Kannegala, Bangalore, IN;

Segev Wasserkrug, Haifa, IL;

Sergey N Zeltyn, Haifa, IL;

Assignee:

International Business Machines Corporation, Armonk, NY (US);

Attorney:

Primary Examiner:

Bryce Bonzo

Assistant Examiner:

Elmira Mehrmanesh

Int. Cl.

CPC ...

G06F 11/00 (2006.01); G06F 11/32 (2006.01); G06F 11/07 (2006.01);

U.S. Cl.

CPC ...

G06F 11/321 (2013.01); G06F 11/0793 (2013.01);

Abstract

A system for analyzing one or more process of software defect handling using one or more percentile-based statistical metric is provided herein. The system may include: a monitoring unit that is configured to monitor one or more processes of software defect handling, to yield monitored samples. The system further includes a percentile-based generator configured to generate one or more statistical metric that are at least partially based on percentile, further based on the monitored samples and further responsive to user selection; and a statistical calculation unit configured to apply the generated one or more statistical metric to real-time handling time samples obtained from the one or more processes of software defect handling, to yield a percentile-based analysis of the processes of software defect handling. The system may further include and a visual representation unit configured to visually present the percentile-based analysis responsive to preferences specified by the user.

Find Patent Forward Citations

Cantor, Murray. (2015). Analyzing a process of software defects handling using percentile-based metrics (U.S. Patent No. 9021308). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9021308

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