The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Jan. 22, 2013
Applicant:

Hrl Laboratories, Llc, Malibu, CA (US);

Inventors:

Ryan Compton, Los Angles, CA (US);

Hankyu Moon, Oak Park, CA (US);

Tsai-Ching Lu, Wynnewood, PA (US);

Assignee:

HRL Laboratories, LLC, Malibu, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 5/02 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06N 7/00 (2013.01); G06N 5/04 (2013.01);
Abstract

Described is a system for catastrophe prediction. The system generates a time series of observables at multiple time steps from data observed from a complex system. A surrogate time series based on the time series of observables is then generated. Inferred network structures for both the time series of observables and the surrogate time series are reconstructed. Next, spatial autocorrelation for each inferred network structure in both the time series of observables and the surrogate time series is computed. A statistical test of a detected trend between the time series of observables and the surrogate time series is computed to determine if the detected trend occurred by chance. Finally, an early warning signal of the detected trend occurring by chance is generated.


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