The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Apr. 09, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yen-Fu Chen, Austin, TX (US);

John W. Dunsmoir, Round Rock, TX (US);

Abhay Pradhan, Humayun Nagal, IN;

Hari Shankar, Cary, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06G 7/62 (2006.01); H04L 12/26 (2006.01); G06F 9/50 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); G06F 9/50 (2013.01); H04L 12/2697 (2013.01); H04L 41/147 (2013.01); H04L 41/5003 (2013.01); H04L 41/5035 (2013.01); H04L 41/22 (2013.01);
Abstract

Provided are techniques for demonstrating the efficiency and effectiveness of a customer's information technology (IT) system and applications operating in a shared IT, or electronic business on-demand, environment. A test suite mimics hypothetical settings in an on-demand services environment () and then determines how the settings affect the allocation of resources in the on-demand services environment (). The calculated allocation of resources is then compared to one or more service level agreements (SLAs) in order to determine compliance with a particular SLA.


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