The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Nov. 30, 2007
Mostafa Rassaian, Bellevue, WA (US);
Jonathan H. Gosse, Issaquah, WA (US);
Stephen Christensen, Sammamish, WA (US);
Mostafa Rassaian, Bellevue, WA (US);
Jonathan H. Gosse, Issaquah, WA (US);
Stephen Christensen, Sammamish, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method of analyzing the durability of a structure. Load-controlled testing is performed on samples of a composite material of the structure to relate critical strain invariants of the material to cyclic rates of strain invariant accumulation and frequencies associated with the cyclic rates. The material is characterized based on effective properties of the material, including the cyclic rates of strain invariant accumulation. Laminate properties and a geometrical definition of the structure are used to obtain a parametric model. Material characterizations are used to determine model element frequency responses to applied load conditions. Each element's frequency responses and critical strain invariants are used to determine whether damage is indicated at the element. Progression of damage is tracked and accounted for in the model.