The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Feb. 22, 2011
Applicants:
Susumu Maruyama, Tsurugashima, JP;
Hideyuki Tsuchikiri, Asaka, JP;
Koji Fukuda, Hanno, JP;
Atsushi Demachi, Koganei, JP;
Inventors:
Susumu Maruyama, Tsurugashima, JP;
Hideyuki Tsuchikiri, Asaka, JP;
Koji Fukuda, Hanno, JP;
Atsushi Demachi, Koganei, JP;
Assignee:
Honda Motor Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/00 (2006.01); G06F 7/00 (2006.01); G01R 33/02 (2006.01); G01R 31/04 (2006.01); G01R 33/038 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/02 (2013.01); G01R 31/04 (2013.01); G01R 33/0385 (2013.01); G01R 31/006 (2013.01);
Abstract
In the disclosed method of measuring contact failure and contact failure measuring device, the magnitude of the excessive response fluctuation of the inductive magnetic field around a harness under measurement when an external force is applied to a terminal fitting part of the harness is detected by a magnetic sensor, and the result is displayed as an index of the quality of the contact state of the terminal fitting part.