The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Apr. 01, 2010
Applicants:
Wei Hua Zhou, Beijing, CN;
Yi Zhang, Beijing, CN;
Malgorzata Tomala, Nowe Miasto nad Pilica, PL;
Inventors:
Assignee:
Nokia Solutions and Networks Oy, Espoo, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 16/18 (2009.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04W 16/18 (2013.01); H04L 43/067 (2013.01);
Abstract
The present invention provides a method, apparatus, and a computer program product for performing one or more minimizing drive test (MDT) measurements, defining a validity time threshold for each kind of MDT measurement, verifying, prior to reporting one of the MDT measurement results, whether the validity time threshold defined for the respective MDT measurement result to be reported, is exceeded, and, if the validity time threshold is not exceeded, reporting the MDT measurement result.