The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Feb. 07, 2012
Applicants:
Yu-lung Lo, Tainan, TW;
Jing-feng Weng, Tainan, TW;
Inventors:
Yu-Lung Lo, Tainan, TW;
Jing-Feng Weng, Tainan, TW;
Assignee:
National Cheung Kung University, Tainan, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/40 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 2207/10028 (2013.01);
Abstract
A method to detect and remove noise in image reconstruction. The method includes integration of filters and phase unwrapping algorithms for removing speckle noise, residual noise and noise at the lateral surface of height discontinuities. The method is used for generating a noise-free unwrapped phase map and hence, a successful image reconstruction of an object image.