The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Dec. 15, 2011
Applicants:
Yisheng Yao, Sammamish, WA (US);
Ke-cheng Huang, Sammamish, WA (US);
Emmanuel Papirakis, Bellevue, WA (US);
Patrick E. Plaisted, Redmond, WA (US);
Inventors:
Yisheng Yao, Sammamish, WA (US);
Ke-Cheng Huang, Sammamish, WA (US);
Emmanuel Papirakis, Bellevue, WA (US);
Patrick E. Plaisted, Redmond, WA (US);
Assignee:
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); H04N 19/154 (2014.01); H04N 19/40 (2014.01); H04N 19/192 (2014.01);
U.S. Cl.
CPC ...
H04N 19/154 (2013.01); H04N 19/40 (2013.01); H04N 19/192 (2013.01);
Abstract
Described is a technology by which an image is transcoded to a desired quality measure (e.g., PSNR). A quality measure of transcoded image data is checked against a desired quality measure, and if a desired quality measure is not achieved, a different quality level is iteratively provided to attempt to re-transcode the image until the desired quality measure is achieved.