The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Jul. 13, 2012
Sung-wook Park, Gangwon-do, KR;
Jin-yong Lee, Gangwon-do, KR;
Sung-wook Park, Gangwon-do, KR;
Jin-yong Lee, Gangwon-do, KR;
Samsung Medison Co., Ltd., Gangwon-Do, JP;
Abstract
Method and apparatus for measuring an object in a captured image. The method includes: receiving a captured image from a photographing apparatus; selecting a predetermined region on the received image based on a user input; magnifying an image with respect to the selected, predetermined region; obtaining brightness information of the received image; displaying at least one of the magnified image and the obtained brightness information; and selecting the object on the magnified image based on the obtained brightness information. The method may further include: obtaining pixel information of the received image; and measuring the selected object based on the pixel information.