The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Aug. 23, 2013
Technoimaging, Llc, Salt Lake City, UT (US);
Michael S. Zhdanov, Holladay, UT (US);
Leif H. Cox, Francis, UT (US);
TechnoImaging, LLC, Salt Lake City, UT (US);
Abstract
A method of multinary inversion for imaging objects with discrete physical properties of the examined medium is described. The model parameters of the target area are parameterized in terms of a multinary function of the physical properties that accepts a finite number of discrete values from the continuum of at least one physical property. The multinary function is chosen such that the derivative of the multinary function with respect to the physical property is a continuous and known function. The imaging is based on solving the optimization problem for parametric functional of the multinary functions describing the target model parameters. The method can be applied for multi-modal imaging, such that at least one physical property representing the physical properties of the examined medium, may be derived to provide a reconstruction or classification of the physical properties of the examined medium.