The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Dec. 16, 2013
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Xiaoyu Wang, Sunnyvale, CA (US);
Shenghuo Zhu, Santa Clara, CA (US);
Ming Yang, Sunnyvale, CA (US);
Yuanqing Lin, Sunnyvale, CA (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6232 (2013.01);
Abstract
Systems and methods are disclosed for object detection by receiving an image; segmenting the image; extracting features from the image; and performing a dimension-wise spatial layout selection to pick up dimensions inside a discriminative spatial region for classification.