The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Apr. 02, 2014
Lsi Corporation, San Jose, CA (US);
Haitao Xia, San Jose, CA (US);
Rui Cao, San Jose, CA (US);
Lingyan Sun, Longmont, CO (US);
Lu Pan, San Jose, CA (US);
LSI Corporation, San Jose, CA (US);
Abstract
A method for detecting an information pattern includes obtaining a first sample stream and a second sample stream. The first sample stream and the second sample stream are obtained by sensing recorded information at a target location of a storage medium using a first sensor and a second sensor, respectively. A first metric is computed by comparing the first sample stream to a reference pattern representative of a target information pattern to be detected. A second metric is computed by comparing the second sample stream to the reference pattern. A combined metric is computed by combining the first metric and second metric using a weighting function. The target information pattern is detected using the combined metric.