The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Dec. 29, 2010
Applicants:

Dong-hyun Kim, Seoul, KR;

Kyu-jung Kim, Seoul, KR;

Jong-ryul Choi, Seoul, KR;

Won-ju Lee, Ansan, KR;

Young-jin OH, Seoul, KR;

Inventors:

Dong-Hyun Kim, Seoul, KR;

Kyu-Jung Kim, Seoul, KR;

Jong-Ryul Choi, Seoul, KR;

Won-Ju Lee, Ansan, KR;

Young-Jin Oh, Seoul, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 5/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 5/008 (2013.01); G01N 21/648 (2013.01); G01N 21/6458 (2013.01);
Abstract

A total internal reflection fluorescence imaging apparatus according to an embodiment of the invention includes: a metal nanostructure layer, which includes a metal thin film and a nanostructure formed over the metal thin film; a light source unit, which provides incident light such that the incident light is totally reflected off the metal nanostructure layer and an evanescent wave localized in a horizontal direction is created between the metal nanostructure layer and a specimen arranged over the metal nanostructure layer; and a fluorescence image extracting unit, which extracts and images a fluorescence signal generated by the specimen due to the evanescent wave localized in a horizontal direction.


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