The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Jun. 20, 2014
Applicant:

3shape A/s, Copenhagen K, DK;

Inventors:

Christian Romer Rosberg, Copenhagen V, DK;

Bo Esbech, Copenhagen Ø, DK;

Assignee:

3Shape A/S, Copenhagen K, DK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01); H04N 1/029 (2006.01); H04N 1/00 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
H04N 1/029 (2013.01); H04N 1/00827 (2013.01); G01B 11/2513 (2013.01); G01B 11/2527 (2013.01);
Abstract

A 3D scanner for recording the 3D topography of an object, the 3D scanner includes an illumination unit configured for providing probe light for illuminating the object, where the probe light includes a pattern of light rays; an image sensor for acquiring one or more 2D images of light rays returning from the illuminated object; an optical system including an optical element arranged such that the patterned probe light passes through it when propagating towards the object from the illumination unit along an optical path; and a device for changing the configuration of the optical system between a first and a second configuration, where the change in configuration comprises a change in orientation of the optical element between a first orientation and a second orientation relative to the optical path of the probe light.


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