The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Feb. 27, 2014
Takahiro Fukase, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
Takahiro Fukase, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
Ricoh Company, Limited, Tokyo, JP;
Abstract
An image examination apparatus includes a generation unit configured to generate an examination image for examining a read image; an extraction unit configured to extract, from the examination image, multiple reference points used for alignment between the examination and read images; a calculation unit configured to calculate information on misalignment between positions of the reference points and positions corresponding respectively to the reference points in the read image; an excluding unit configured to exclude a reference point from the multiple reference points, based on the information on misalignment; an alignment unit configured to perform alignment between the examination and read images based on the reference points other than the excluded reference point; and an examination unit configured to perform examination for determining whether there is a defect in the read image on the basis of a difference between the read and examination images.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile