The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Jan. 31, 2012
Adam T. Black, Mountain View, CA (US);
Todd L. Gustavson, Sunnyvale, CA (US);
Brenton C. Young, Menlo Park, CA (US);
Adam T. Black, Mountain View, CA (US);
Todd L. Gustavson, Sunnyvale, CA (US);
Brenton C. Young, Menlo Park, CA (US);
AOSense, Inc., Sunnyvale, CA (US);
Abstract
A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first group of atoms and a second group of atoms traverse an interrogating region of the atom interferometer in substantially opposite directions. The interrogating beams interact substantially simultaneously with both atoms in the first group and atoms in the second group. The first group of atoms and the second group of atoms interact with each of the interrogating beams in a different order. The processor is configured to determine a phase adjustment offset of at least one interrogating beam based at least in part on one or more past interactions of one or more interrogating beams with either the first group of atoms or the second group of atoms.