The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Feb. 17, 2012
Applicants:
Ding-zheng Lin, Taipei, TW;
Yi-ping Chen, Kaohsiung, TW;
Tsung-dar Cheng, Taipei, TW;
I-ling Kao, Taipei, TW;
Ping-chen Chen, Taipei, TW;
Inventors:
Ding-Zheng Lin, Taipei, TW;
Yi-Ping Chen, Kaohsiung, TW;
Tsung-Dar Cheng, Taipei, TW;
I-Ling Kao, Taipei, TW;
Ping-Chen Chen, Taipei, TW;
Assignee:
Industrial Technology Research Institute, Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/658 (2013.01);
Abstract
The invention provides a surface-enhanced Raman scattering substrate and a trace detection method of a biological and chemical analyte using the same. The substrate includes: a substrate having a periodic nanostructure; a reflection layer formed on the substrate; a dielectric layer formed on the reflection layer; and a metal thin film layer formed on the dielectric layer.