The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Jun. 24, 2013
Applicant:

Recognition Robotics, Inc., Elyria, OH (US);

Inventor:

Simon Melikian, Westlake, OH (US);

Assignee:

Recognition Robotics, Inc., Elyria, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/275 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2755 (2013.01); G01B 2210/14 (2013.01);
Abstract

A method for measuring wheel alignment of a test wheel rotating about a z-axis using at least one camera and a processor includes obtaining a calibration point from a calibration image of a zero-offset wheel that is the same size as the test wheel and that rotates about the z-axis, obtaining at least one test image of the test wheel with the camera and a non-structured light source, and locating a measurement point in the test image. The measurement point coincides with a radius that the calibration point is offset from the z-axis and the angular displacement of the calibration point from the vertical diameter of the zero-offset wheel. The measurement point is further located based on a change of reflectivity between other points in the test image adjacent the measurement point.


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