The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Mar. 08, 2012
Nobuhiko Maiya, Yokohama, JP;
Nobuhiko Maiya, Yokohama, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A microscope apparatus and control method. An image processing unit obtains an image on a plane observation cross-section inside a sample. A drive control unit controls a galvano-scanner and a z drive unit, and inclines the entire observation cross-section in a direction where the cross-section of an observation target that appears in the image becomes long. When an edge portion of the cross-section of the observation target is detected in the observation cross-section while gradually inclining the observation cross-section, the drive control unit uses an axis passing through the edge portion as the center to incline a part of the observation cross-section located on a side, where the cross-section of the observation target does not appear, from among the sides having this axis as a boundary, in a direction where the cross-section of the observation target appears, so as to form the observation cross-section having a profile which is folded.
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