The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Jul. 27, 2012
Applicants:

Chintan Intwala, Santa Clara, CA (US);

Gregg D. Wilensky, Palisades, CA (US);

Baljit S. Vijan, Foster City, CA (US);

Mausoom Sarkar, New Delhi, IN;

Inventors:

Chintan Intwala, Santa Clara, CA (US);

Gregg D. Wilensky, Palisades, CA (US);

Baljit S. Vijan, Foster City, CA (US);

Mausoom Sarkar, New Delhi, IN;

Assignee:

Adobe Systems Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G06T 5/20 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G06T 5/00 (2013.01); G06T 5/001 (2013.01); G06T 5/003 (2013.01); G09G 2340/12 (2013.01);
Abstract

Methods and apparatus for specifying complex continuous gradients. A field blur tool may provide a user interface through which users may apply instances of a field blur pattern. The field blur tool allows the user to place one, two, or more pins over the image and to specify the blur amount (blur radius) at each field blur pin. A blur algorithm distributes the blur values for the one or more instances of the field blur pattern over the entire image, applying the blur according to the locations of the pin(s) and blur parameters at the pin(s). If the input indicates the location and the value for the blur radius of each of two or more instances of the field blur pattern, the two or more instances of the field blur pattern are combined in a blur mask by multiplying normalized radius fields of each of the instances.


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