The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Apr. 18, 2011
Applicants:

Peng Lai, Union City, CA (US);

Weitian Chen, Palo Alto, CA (US);

Inventors:

Peng Lai, Union City, CA (US);

Weitian Chen, Palo Alto, CA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/561 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5611 (2013.01); G01R 33/56563 (2013.01);
Abstract

A method for processing magnetic resonance imaging data includes accessing the magnetic resonance imaging data, the data including a plurality of magnetic resonance data sets each collected at different excitation frequencies and defining reconstructable images representative of sections of a single image of a subject. Each magnetic resonance data set includes sampled data for sampled phase encoding points but is missing data for unsampled phase encoding points. The method further includes determining the missing data of at least one of the magnetic resonance data sets using a correlation between the sampled data for the respective magnetic resonance data set and sampled data from at least one other magnetic resonance data set within a spectral window encompassing at least the respective magnetic resonance data set and the at least one other magnetic resonance data set.


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