The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Jul. 08, 2009
Linqing LI, Oxford, GB;
Bruce Balcom, Frederiction, CA;
Derrick Green, Fredericton, CA;
Oleg Petrov, Fredericton, CA;
Linqing Li, Oxford, GB;
Bruce Balcom, Frederiction, CA;
Derrick Green, Fredericton, CA;
Oleg Petrov, Fredericton, CA;
Other;
Abstract
A method of measuring a parameter in a sample by imaging at least a portion of the sample using a spin-echo single-point imaging (SE-SPI) pulse sequence. This method involves applying a pure phase encoding to the SE-SPI pulse sequence, acquiring a multiplicity of echoes, and determining the spatially resolved Tdistribution. In another embodiment, individual echoes are separately phase encoded in a multi-echo acquisition and the SE-SPI pulse sequence is a hybrid SE-SPI sequence. In another embodiment, an external force can be used to build up a distribution of saturations in the sample, and a Tdistribution can be measured for the sample, which is then used to determine a parameter of the sample. A spatially resolved Tdistribution can also be measured and a resulting spatially resolved Tdistribution used to determine the Tdistribution as a function of capillary pressure.