The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
May. 16, 2014
Applicant:
Brechtel Manufacturing, Inc., Hayward, CA (US);
Inventor:
Fredrick J Brechtel, Berkeley, CA (US);
Assignee:
Brechtel Manufacturing, Inc., Hayward, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01); G01N 27/68 (2006.01); G01R 29/24 (2006.01); H01J 27/02 (2006.01); G01N 27/62 (2006.01); H01J 49/14 (2006.01);
U.S. Cl.
CPC ...
G01R 29/24 (2013.01); H01J 27/02 (2013.01); G01N 27/624 (2013.01); H01J 49/145 (2013.01);
Abstract
A system and method comprising an ion production chamber having a plasma source disposed in said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.