The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
May. 07, 2014
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Mark A. Kasevich, Palo Alto, CA (US);
Jason M. Hogan, Palo Alto, CA (US);
Susannah M. Dickerson, Palo Alto, CA (US);
Alex Sugarbaker, Atherton, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
In an atom interferometer, improved results are obtained by configuring the interferometer to have a baseline fringe pattern, in combination with spatially resolved measurements at the interferometer ports. Two aspects of this idea are provided. In the first aspect, the atoms are configured to expand from an initial point-like spatial distribution. The result is an informative correlation between atom position and interferometer phase. In the second aspect, a phase shear is applied to the atom ensemble of an atom interferometer. In both cases, spatially resolved measurements at the interferometer ports can provide enhanced interferometer performance, such as single-shot operation.