The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Sep. 20, 2012
Applicants:

Hiroko Nakamura, Kanagawa-ken, JP;

Satoshi Mikoshiba, Kanagawa-ken, JP;

Atsushi Hieno, Kanagawa-ken, JP;

Shigeki Hattori, Kanagawa-ken, JP;

Inventors:

Hiroko Nakamura, Kanagawa-ken, JP;

Satoshi Mikoshiba, Kanagawa-ken, JP;

Atsushi Hieno, Kanagawa-ken, JP;

Shigeki Hattori, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01); G03F 7/40 (2006.01); H01L 21/308 (2006.01); H01L 21/027 (2006.01); H01L 21/033 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
G03F 7/40 (2013.01); Y10T 428/24802 (2015.01); G03F 7/26 (2013.01); H01L 21/308 (2013.01); H01L 21/0276 (2013.01); H01L 21/0337 (2013.01); H01L 21/32139 (2013.01);
Abstract

According to one embodiment, a pattern formation method includes forming a pattern on a layer. The layer has a first surface energy and includes a silicon compound. The pattern has a second surface energy different from the first surface energy. The method includes forming a block polymer on the layer and the pattern. The method includes forming a structure selected from a lamellar structure and a cylindrical structure of the block polymer containing polymers arranged by microphase separation. The lamellar structure is oriented perpendicularly to the layer surface. The cylindrical structure is oriented so as to have an axis parallel to a normal line of the layer surface. The second surface energy is not less than a maximum value of surface energies of the polymers or not more than a minimum value of the surface energies of the polymers.


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