The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Feb. 13, 2007
Applicants:

Woon Fong Wallace Leung, Kowloon, HK;

Kin Tak Alan Lau, Kowloon, HK;

Inventors:

Woon Fong Wallace Leung, Kowloon, HK;

Kin Tak Alan Lau, Kowloon, HK;

Assignee:

The Hong Kong Polytechnic University, Hung Hom, Kowloon, HK;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 19/00 (2006.01); A61B 5/00 (2006.01); B25J 11/00 (2006.01); G09B 23/28 (2006.01); G09B 23/30 (2006.01);
U.S. Cl.
CPC ...
B25J 11/00 (2013.01); G09B 23/28 (2013.01); G09B 23/30 (2013.01);
Abstract

The present invention teaches a system for the automated palpation testing of a patient, including the use of a robotic device with a actuating element thereto. The system is useful for testing patients at risk of nerve degradation, such as diabetic sufferers. The system includes a controller for programming the robotic device to administer the test in a particular pattern, and a storage medium for storing the results of the test. The system allows a more accurate determination of the stage of nerve degradation, as well as being more standardized because of the inclusion of automation technology.


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