The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Oct. 09, 2013
Applicant:

Beijing Information Science & Technology University, Beijing, CN;

Inventors:

Lianqing Zhu, Beijing, CN;

Fei Luo, Winchester, MA (US);

Wei He, Beijing, CN;

Mingli Dong, Beijing, CN;

Yinmin Zhang, Beijing, CN;

Yudong Jia, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01L 1/242 (2013.01); G01L 1/246 (2013.01);
Abstract

A method for measuring the strain of material using a short cavity fiber laser, includes steps of: a) arranging the short cavity fiber laser, which laser comprises sequentially coupled laser diode pumping source, a wavelength division multiplexer, a fiber bragg grating, an active fiber and a loop mirror; b) fixing the short cavity fiber laser on the material whose strain will be measured, and matching the stretching direction of the fiber of the short cavity fiber laser with the direction of the strain produced by the material to be measured; c) measuring the drift amount of longitudinal mode output by the short cavity fiber laser; and d) calculating and obtaining the strain of the material to be measured.


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