The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
May. 04, 2011
Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source
Applicants:
Elisa Leonor Román García, Madrid, ES;
Lidia Martínez Orellana, Madrid, ES;
Mercedes Díaz Lagos, Madrid, ES;
Yves Huttel, Madrid, ES;
Inventors:
Elisa Leonor Román García, Madrid, ES;
Lidia Martínez Orellana, Madrid, ES;
Mercedes Díaz Lagos, Madrid, ES;
Yves Huttel, Madrid, ES;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/12 (2010.01); G01Q 60/38 (2010.01); G01Q 60/42 (2010.01); B82Y 15/00 (2011.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01Q 60/38 (2013.01); B82Y 15/00 (2013.01); B82Y 35/00 (2013.01); G01Q 60/42 (2013.01);
Abstract
The present invention relates to a method for covering Atomic Force Microscopy (AFM) tips by depositing a material in the form of nanoparticles with an aggregate source.