The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Jul. 01, 2013
Oracle International Corporation, Redwood Shores, CA (US);
Reza B'Far, Huntington Beach, CA (US);
Kent Spaulding, Portland, OR (US);
Yasin Cengiz, Irvine, CA (US);
Americo Caves, Irvine, CA (US);
Paiting Ou, Irvine, CA (US);
Christopher Hluchan, Glendale, CO (US);
Venkata Sree Ramya Manchikanti, Irvine, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Reputation metrics are used to gauge risk of individuals to an organization, such as employees of a business. The reputation metrics may be calculated from both internal and external data sources, including social network profiles of the individuals. Calculations of risk are used to make determinations regarding the activities the individuals are authorized to engage in.