The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Oct. 05, 2012
Applicant:
Lsi Corporation, Milpitas, CA (US);
Inventors:
Chung-Li Wang, San Jose, CA (US);
Dan Liu, Shanghai, CN;
Qi Zuo, Shanghai, CN;
Zongwang Li, San Jose, CA (US);
Shaohua Yang, San Jose, CA (US);
Assignee:
LSI Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/09 (2006.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/09 (2013.01); H03M 13/1117 (2013.01); H03M 13/114 (2013.01); H03M 13/116 (2013.01); H03M 13/1171 (2013.01); H03M 13/6331 (2013.01); H03M 13/6343 (2013.01); H03M 13/658 (2013.01);
Abstract
The present inventions are related to systems and methods for decoding data in an LDPC layer decoder for LDPC codes with overlapped circulants.
Wang, Chung-Li. (2015). Low density parity check layer decoder for codes with overlapped circulants (U.S. Patent No. 9015550). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9015550
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile