The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Aug. 30, 2012
Applicants:

Giacomo Losio, Tortona, IT;

Gilberto Loprieno, Milan, IT;

Inventors:

Giacomo Losio, Tortona, IT;

Gilberto Loprieno, Milan, IT;

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04J 3/14 (2006.01); H04L 12/26 (2006.01); H04B 10/00 (2013.01); H04B 10/077 (2013.01);
U.S. Cl.
CPC ...
H04J 3/14 (2013.01); H04B 10/0773 (2013.01); H04L 43/0858 (2013.01); H04J 2203/0057 (2013.01);
Abstract

In one embodiment, a one-way delay is measured between optical devices in an optical transport network based on roundtrip times of request and corresponding response frames. A first optical device sends a sequence of delay measurement request frames to a second optical device, which varies a local delay before responding to a request frame, thus causing a slippage in the sequence of reply frames received by the first device. The point at which the request frames are received in relation to the stream of frames sent by the optical device can be identified based on the frame slippage. Therefore, the delay measurement can be adjusted by a corresponding offset to the beginning of a frame in order to increase the accuracy of the one-way delay measurement.


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