The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Nov. 23, 2012
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Sudhanshu Gaur, Santa Clara, CA (US);

Long Gao, Santa Clara, CA (US);

Joydeep Acharya, Sunnyvale, CA (US);

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/08 (2009.01); H04J 11/00 (2006.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04W 72/082 (2013.01); H04J 11/0053 (2013.01); H04J 11/0056 (2013.01); H04L 5/0073 (2013.01);
Abstract

A communications system employing CoMP transmission to suppress interference comprises: a CoMP user equipment; and a plurality of base stations, one of the base stations being an associated base station of the CoMP user equipment to transmit data to the CoMP user equipment, the plurality of base stations including multiple CoMP base stations for the CoMP user equipment. The CoMP base stations for the CoMP user equipment transmit CoMP downlink data, including subframes which comprise physical resource blocks having a plurality of resource elements (REs) and cell-specific reference signal (CRS) resource element (RE) locations. PDSCH bit-level muting or puncturing information is determined, based on radio resource management measurement and the subframes sent from the multiple CoMP base stations, to identify PDSCH REs that suffer strong CRS interference transmission from within the multiple CoMP base stations and are to be subjected to one of bit-level muting or bit-level puncturing.


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