The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Aug. 08, 2011
Shyam P. Keshavmurthy, Ann Arbor, MI (US);
Chengchih Lin, Ann Arbor, MI (US);
Alfred A. Pease, Ann Arbor, MI (US);
Richard A. Krakowski, Troy, MI (US);
Shyam P. Keshavmurthy, Ann Arbor, MI (US);
Chengchih Lin, Ann Arbor, MI (US);
Alfred A. Pease, Ann Arbor, MI (US);
Richard A. Krakowski, Troy, MI (US);
Perceptron, Inc., Plymouth, MI (US);
Abstract
A structured light sensor system for measuring contour of a surface includes a control module that coordinates control of both a projection system and an imaging system to operate the structured light sensor system in three different modes. The imaging system is configured to selectively capture an image of light reflected off of the surface. In point mode, the imaging system is on for a first period during which the projection system projects a point of light onto the surface. In line mode, the imaging system is on for a second period during which the projection system projects onto the surface a first plurality of points of light forming a line of light. In area mode, the imaging system is on for a third period during which the projection system projects onto the surface a second plurality of points of light forming a plurality of lines of light.