The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Dec. 21, 2012
Horiba, Ltd., Kyoto, JP;
Toshikazu Ohnishi, Kyoto, JP;
Toshiyuki Tsujimoto, Kyoto, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A gas analyzing apparatus includes a probe for measuring a concentration of sample gas flowing in a pipe by an optical measurement system. Influence of a thermal lens effect phenomenon is suppressed so that measurement accuracy is improved. The apparatus includes a probe tube disposed to cross a flow path of the sample gas in the pipe to introduce the sample gas flowing in the pipe to a predetermined hollow measurement region. A light emission portion and a light receiving portion for project measurement light to the measurement region in the probe tube and receive the measurement light after passing through the sample gas in the measurement region. A purge gas feed tube disposed in the probe tube supplies purge gas to a region between the optical system members and the measurement region, with a gap to the inner wall surface of the probe tube.