The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
May. 21, 2013
Pascual Sevillano Reyes, Saragossa, ES;
Jesus Subías Domingo, Saragossa, ES;
Javier Pelayo Zueco, Saragossa, ES;
Carlos Heras Vila, Saragossa, ES;
Asier Villafranca Velasco, Saragossa, ES;
Francisco Manuel Lopez Torres, Saragossa, ES;
Pascual Sevillano Reyes, Saragossa, ES;
Jesus Subías Domingo, Saragossa, ES;
Javier Pelayo Zueco, Saragossa, ES;
Carlos Heras Vila, Saragossa, ES;
Asier Villafranca Velasco, Saragossa, ES;
Francisco Manuel Lopez Torres, Saragossa, ES;
Aragon Photonics Labs S.L.U., Zaragoza, ES;
Fibercom S.L., Zaragoza, ES;
Abstract
The present invention relates to a system and method for measuring a wavelength-resolved state of polarization, for calculating differential group delay of an optical signal under analysis () by means of taking multiple measurements of the spectrum of the signal under analysis () with spectral filtering means () with an optical output the power of which depends on the polarization of the input. The polarization at the input of the spectral filtering means () is modified by means of a polarization transformer () which sequentially selects a plurality of output states of polarization. The spectral filtering means () can comprise a filter based on stimulated Brillouin scattering amplification () simultaneously combining wavelength discrimination and polarization discrimination.