The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Mar. 13, 2014
Applicant:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Inventors:

Takeshi Yamamoto, Kobe, JP;

Seiichiro Tabata, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe-Shi, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/53 (2006.01); G01N 15/14 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/53 (2013.01); G01N 2015/144 (2013.01); G01N 2015/1006 (2013.01); G01N 15/1459 (2013.01); G01N 15/1434 (2013.01);
Abstract

A particle analyzer comprises a light source, a flow cell, an irradiating optical system, and a light receiving optical system. The light receiving optical system comprises a light focusing lens system which includes a light focusing lens configured to focus forward scattered light from the particles, a light receiving member configured to receive the forward scattered light, and a beam stopper. The beam stopper is provided in the light path between the light focusing lens system and the light receiving member. The light focusing lens has an aspheric lens form. The light focusing lens system is configured such that the focal distance of the forward scattered light through the central area which includes the optical axis is longer than the focal distance of the forward scattered light through the peripheral area outside the central area.


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