The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Nov. 26, 2013
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

Ching-Nan Lin, New Taipei, TW;

Chia-Yi Chen, New Taipei, TW;

Chun-Yi Wu, New Taipei, TW;

Kuo-Ting Ho, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/73 (2006.01); H04N 9/69 (2006.01);
U.S. Cl.
CPC ...
H04N 9/73 (2013.01); H04N 9/69 (2013.01);
Abstract

A method and a system for adjusting display parameters are provided. In the method, at least one real display parameter of a display to be adjusted is measured. A target template in accordance with the at least one real display parameter is searched from a plurality of templates stored in a database and target parameter adjusting data recorded in the searched target template is obtained, in which each template in the database records the at least one reference display parameter of a tested display and the reference parameter adjusting data used to adjust the tested display. Finally, the display is set and adjusted according to the obtained target parameter adjusting data.


Find Patent Forward Citations

Loading…