The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Jun. 27, 2011
Applicants:

Goh Matsunobu, Kanagawa, JP;

Takamichi Yamakoshi, Tokyo, JP;

Inventors:

Goh Matsunobu, Kanagawa, JP;

Takamichi Yamakoshi, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G06K 9/32 (2006.01); G02B 21/12 (2006.01); G02B 21/36 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/125 (2013.01); G02B 21/26 (2013.01); G02B 21/365 (2013.01); G06K 9/00127 (2013.01); G06K 9/3216 (2013.01); G06K 2009/3225 (2013.01);
Abstract

Provided is a microscope including: dark field illumination and bright field illumination which illuminate a preparat where a sample mounted on a slide glass is covered with a cover glass and a mounting agent; an image capturing unit which acquires a dark field image by image-capturing the preparat illuminated by the dark field illumination and which acquires a bright field image by image-capturing the preparat illuminated by the bright field illumination; and a magnified portion image acquisition area determination unit which detects an edge of the cover glass in the preparat based on the dark field image and the bright field image acquired by the image capturing unit and determines an internal area of the detected edge of the cover glass as a magnified portion image acquisition area of the sample.


Find Patent Forward Citations

Loading…