The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Mar. 08, 2011
Applicants:

Mamoru Kikuta, Saitama, JP;

Kenjiro Miura, Shizuoka, JP;

Inventors:

Mamoru Kikuta, Saitama, JP;

Kenjiro Miura, Shizuoka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 17/20 (2006.01); G06T 15/04 (2011.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 15/04 (2013.01); Y02T 10/82 (2013.01);
Abstract

A polygon-meshed surface of a product is divided into regions, and a texture GA is mapped in an initial region A. The boundary line of an adjacent region B is multiplexed outward, and an overlapped region D is provided between the initial region and the adjacent region, and a region X to be processed is projected onto a two-dimensional plane and a texture GB is allocated. An optimal boundary line FS in which the difference between the pixel values of the textures GA and GB becomes minimal in the overlapped region is obtained, and the texture GB is mapped in the region X being processed so that the texture is connected to the texture GA at the optimal boundary line. The apexes of the polygon mesh displaced on the basis of the textures mapped in all the regions are connected to obtain grain-given polygon data.


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