The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Nov. 13, 2012
Applicant:

Apple, Inc., Cupertino, CA (US);

Inventors:

Peter Ashwood-Smith, Hull, CA;

Delfin Y. Montuno, Kanata, CA;

Abel Dasylva, Kanata, CA;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 13/14 (2006.01); G08B 13/24 (2006.01); G01S 5/02 (2010.01); G01S 13/75 (2006.01); G06K 7/10 (2006.01); G06K 19/077 (2006.01); G06K 17/00 (2006.01);
U.S. Cl.
CPC ...
G08B 13/2428 (2013.01); G01S 5/0247 (2013.01); G01S 13/758 (2013.01); G06K 7/10079 (2013.01); G06K 19/07749 (2013.01); G06K 19/07767 (2013.01); G06K 2017/0045 (2013.01);
Abstract

Method and systems to detect tampering in a physical article are described herein. A method includes receiving, at a first point in time, at least two response signals from at least one RF tag in a set of RF tags associated with the physical article; forming a first response signature for the physical article based on the received response signals; receiving a second response signal from at least one other RF tag in the set of RF tags associated with the physical article at a second point in time; assessing a relative spacing between the RF tags associated with the physical article has changed from the first point in time to the second point in time; and determining tampering of the physical article as a result of the spacing assessment.


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