The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Jul. 23, 2013
Applicants:
Paul R. Selvin, Urbana, IL (US);
Ruobing Zhang, Williamstown, MA (US);
Eli Rothenberg, New York, NY (US);
Inventors:
Paul R. Selvin, Urbana, IL (US);
Ruobing Zhang, Williamstown, MA (US);
Eli Rothenberg, New York, NY (US);
Assignee:
Board of Trustees of the University of Illinois, Urbana, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01N 21/6458 (2013.01);
Abstract
Microscopy is performed by imaging individual quantum dots (QD) using two-photon (2P) microscopy of in an aqueous environment with widefield and point-scan excitations at nanometer accuracy.