The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Jan. 14, 2010
Patrick Courtney, Beaconsfield, GB;
Alois Renn, Zurich, CH;
Patrick Courtney, Beaconsfield, GB;
Alois Renn, Zurich, CH;
Perkinelmer Singapore Pte Ltd., Singapore, SG;
ETH Zürich, Zürich, CH;
Abstract
Methods and apparatus are provided concerning the control of photobleaching of fluorescent labels during the study of samples by fluorescence microscopy. A method is described for operating fluorescence microscopy apparatus to analyse a sample (), the apparatus including input, processing, sample irradiating and detection arrangements (), and the method including the steps of: receiving parameters in the processing arrangement via the input arrangement, wherein the parameters relate to an experiment to be conducted using the apparatus and include at least one parameter relating to a fluorescent label present in the sample; and determining with the processing arrangement an excitation procedure to be carried out during the experiment having regard to the inputted parameters and the rate of photobleaching of the fluorescent label desired during the experiment. Furthermore, confocal fluorescence microscopy apparatus is described which comprises an optical arrangement in the light path from an excitation energy source to a sample which acts to adjust the intensity profile of the light beam across its width so as to be more evenly distributed than a Gaussian profile and/or includes a spinning disk, wherein the rotational speed of the disk is variable under the control of a processing arrangement of the apparatus.