The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Jul. 09, 2013
Wei-chun Hsu, Cambridge, MA (US);
Jonathan Kien-kwok Tong, Cambridge, MA (US);
Bolin Liao, Cambridge, MA (US);
Brian Burg, Cambridge, MA (US);
Gang Chen, Carlisle, MA (US);
Wei-Chun Hsu, Cambridge, MA (US);
Jonathan Kien-Kwok Tong, Cambridge, MA (US);
Bolin Liao, Cambridge, MA (US);
Brian Burg, Cambridge, MA (US);
Gang Chen, Carlisle, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A system for measuring the absorption spectrum of a sample is provided that includes a broadband light source that produces broadband light defined within a range of an absorptance spectrum. An interferometer modulates the intensity of the broadband light source for a range of modulation frequencies. A bi-layer cantilever probe arm is thermally connected to a sample arm having at most two layers of materials. The broadband light modulated by the interferometer is directed towards the sample and absorbed by the sample and converted into heat, which causes a temperature rise and bending of the bi-layer cantilever probe arm. A detector mechanism measures and records the deflection of the probe arm so as to obtain the absorptance spectrum of the sample.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile