The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Feb. 14, 2012
Liejia Qian, Shanghai, CN;
Jingui MA, Shanghai, CN;
Peng Yuan, Shanghai, CN;
Yongzhi Wang, Shanghai, CN;
Dongfang Zhang, Shanghai, CN;
Heyuan Zhu, Shanghai, CN;
Liejia Qian, Shanghai, CN;
Jingui Ma, Shanghai, CN;
Peng Yuan, Shanghai, CN;
Yongzhi Wang, Shanghai, CN;
Dongfang Zhang, Shanghai, CN;
Heyuan Zhu, Shanghai, CN;
Fudan University, Shanghai, CN;
Abstract
A single-shot pulse contrast measuring device based on non-harmonic long-wavelength sampling pulse includes a long-wavelength sampling light generation unit, a large-angle non-collinear sum-frequency cross-correlation unit and a high sensitivity signal receiving unit. The long-wavelength sampling light sum-frequency cross-correlator can allow that the beams are interacted with each other at the large non-collinear angle in the quasi-phase matching crystal, match the measuring window of the high sensitivity signal receiving system, and is in favor of eliminating the scattered light noise, thereby achieving the single measurement of the pulse contrast with large temporal window and high dynamic range. The single-shot pulse contrast measuring device of the present invention has good extensibility at the temporal window and dynamic range, and is adapted for measuring the contrast of the high-power laser with various wavelengths.